TUNING FORK FOR MUSIC = CALIBRATION GRATING FOR
SCANNING PROBE MICROSCOPE

Current microelectronics is based on silicon. However, the further miniaturization of the Si devices is the problem foreseen now. Therefore alternative approaches should be explored. 
DNA-based electronics is a prime example of an entirely alternative approach. Efficient attachment of DNA to metal surfaces or electrodes is essential for charge-transport measurements, scanning tunneling microscopy, and for devices and sensors producing. It will take advantage of the unprecedented recognition and assembling properties of DNA. Such DNA-based nanoelectronic devices will enable to reduce the size of the current devices by approximately 1000 times.

Electrochemical (EC) technologies attract constantly rising interest because it is the way for controlled modifications of the surface even with atomic precision. EC deposition is a widely used approach for creation of thin metal films with unique properties. On the other hand EC dissolution allows imitation and study of corrosion processes. Scanning probe microscopy i.e. Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) techniques open up the possibility to monitor the nanometer scaled changes occurring at the surface during an EC modification. With the NTEGRA nanolaboratory one can run various EC experiments in highly specialized conditions.